Laboratory for Epitaxial Nanostructures on Silicon and Spintronics

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• Polo di Como
• Politecnico di Milano
• Università Milano Bicocca

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Davide Colombo

Researcher

Davide Colombo is currently a process engineer at Micron in Agrate Brianza, Italy

Education

• Masters degree in Materials Science, 2002
• PhD in Materials Science, 2005

Main Research Interest

• Electron beam and optical lithography, wet and reactive ion etching
• Optical spectroscopy of electronic and vibrational properties of bulk and low dimension semiconductors

Publications

1. G. M. Vanacore, M. Zani, M. Bollani, D. Colombo, G. Isella, J. Osmond, R. Sordan, and A. Tagliaferri: Size evolution of ordered SiGe islands grown by surface thermal diffusion on pit-patterned Si(100) surface, Nanoscale Res. Lett. 5, 1921 (2010).
2. R. Sordan, A. Miranda, F. Traversi, D. Colombo, D. Chrastina, G. Isella, M. Masserini, L. Miglio, K. Kern, and K. Balasubramanian: Vertical arrays of nanofluidic channels fabricated without nanolithography, Lab Chip 9, 1556 (2009).
3. A. Trita, F. Bragheri, I. Cristiani, V. Degiorgio, D. Chrastina, D. Colombo, G. Isella, H. von Känel, F. Gramm, E. Müller, M. Döbeli, E. Bonera, R. Gatti, F. Pezzoli, E. Grilli, M. Guzzi, and L. Miglio: Impact of misfit dislocations on wavefront distortion in Si/SiGe/Si optical waveguides, Opt. Commun. 282, 4716 (2009).
4. R. Sordan, A. Miranda, J. Osmond, D. Colombo, D. Chrastina, G. Isella, and H. von Känel: Gate-controlled rectifying barrier in a two-dimensional hole gas, Nanotechnology 19, 335201 (2008).
5. D. Colombo, E. Grilli, M. Guzzi, S. Sanguinetti, S. Marchionna, M. Bonfanti, A. Fedorov, H. von Känel, G. Isella, and E. Müller: Analysis of strain relaxation by microcracks in epitaxial GaAs grown on Ge/Si substrates, J. Appl. Phys. 101, 103519 (2007).
6. D. Colombo, E. Grilli, M. Guzzi, S. Sanguinetti, A. Fedorov, H. von Känel, and G. Isella: Study of thermal strain relaxation in GaAs grown on Ge/Si substrates, J. Lumin. 121, 375 (2006).
7. A. R. Khan, K. Mundboth, J. Stangl, G. Bauer, H. von Känel, A. Federov, G. Isella, and D. Colombo: X-ray investigation of thick epitaxial GaAs/InGaAs layers on Ge pseudosubstrates.In IEEE International Conference on Emerging Technologies (2005).
8. D. Colombo, S. Sanguinetti, E. Grilli, M. Guzzi, L. Martinelli, M. Gurioli, P. Frigeri, G. Trevisi, and S. Franchi: Efficient room temperature carrier trapping in quantum dots by tailoring the wetting layer, J. Appl. Phys. 94, 6513 (2003).